ITC 2007 - Call for Participation

CALL FOR PARTICIPATION

Scope

International Test Conference 2007 will again be held in Santa Clara from October 23–25 2007. The Test Week 2007 Advance Program is now available http://www.itctestweek.org/; see the At-a-Glance schedule for a summary. Register by September 24 for discount rates, and make your hotel reservations online.

International Test Conference, the cornerstone of TestWeek(tm), is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. 16 state-of-the-art full day tutorials on key test topics are also offered.

With the theme "Facing Nanometer-Technology Test Challenges," the 2007 conference will focus on breakthrough ideas to address the challenges of providing high-quality, cost-effective tests for nanometer-technology designs.

For more information, visit the web at: http://www.itctestweek.org/

The International Test Conference (ITC'07) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

CALL FOR PARTICIPATION
Scope
Scope	top
International Test Conference 2007 will again be held in Santa Clara from October 23–25 2007. The Test Week 2007 Advance Program is now available http://www.itctestweek.org/; see the At-a-Glance schedule for a summary. Register by September 24 for discount rates, and make your hotel reservations online. International Test Conference, the cornerstone of TestWeek(tm), is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. 16 state-of-the-art full day tutorials on key test topics are also offered. With the theme "Facing Nanometer-Technology Test Challenges," the 2007 conference will focus on breakthrough ideas to address the challenges of providing high-quality, cost-effective tests for nanometer-technology designs.
For more information, visit the web at: http://www.itctestweek.org/
The International Test Conference (ITC'07) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).